Match the phenomenon with their specific effects on X-ray diffraction patterns
P. Macroscopic residual stress | 1. Additional diffraction lines |
Q. Microscopic residual stress | 2. X-ray line shift |
R. Ordering reaction | 3. Debye rings of non-uniform intensity |
S. Preferred orientation | 4. X-ray line broadening |
A. P-2, Q-4, R-3, S-1
B. P-2, Q-4, R-1, S-3
C. P-4, Q-2, R-3, S-1
D. P-3, Q-4, R-2, S-1
Answer: Option A
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