Which one of the following signals from a specimen is used in a scanning electron microscope to get quantitative elemental analysis?
A. Secondary electrons
B. Backscattered electrons
C. X-rays
D. Transmitted electrons
Answer: Option C
This Question Belongs to Metallurgical Engineering >> Physics Of Metals In Metallurgy
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When the wavelength of the incident X-Tay increases the angle of diffraction
A. decreases
B. increases
C. remains constant
D. shows no systematic variation
A. Burger vector and the dislocation line are Parallel to each other for screw dislocations
B. Burger vector and the dislocation line are perpendicular to each other for edge dislocations
C. Screw dislocations glide parallel to its Burger vector
D. Edge dislocations glide parallel to its Burger Vector
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